Wsparcie Klienta

Advanced UT Phased Array

Introduction

This course is only for personnel that have already successfully completed the TEST NDT, 40 hour Phased Array course and have gained experience using the OmniScan for various applications.

This course will include a brief review of some of the more advanced topics covered in the standard 40 hour course and will expand the attendees knowledge into some of the more advanced capabilities of the OmniScan.

The course consists of a series of hands on demonstrations using the OmniScan through a projector, by the instructor which will then be followed by each student repeating the exercises using their own instruments under supervision and guidance of the instructor.

On successful completion of this course the attendee should feel confident to perform the following functions:

1. Updating software versions using web supplied downloaded software
2. Defining "non standard" probes
3. Importing and exporting probe definitions
4. Defining non standard wedges
5. Importing and exporting wedge definitions
6. Review of Ultrasonic Phased Array procedure development/programming
7. Review of Process control checks and calibrations, including: Encoder, DAC, TCG, Sensitivity, wedge delay
8. Using cursors for accurate sizing from encoded "C scan" images
9. Setting up reading fields
10. Building a defect table and importing into reports
11. Creating and saving data files
12. Importing data files into Tomoviewer
13. Using "Tomoviewer" to analyze data files
14. Setting up and using the "Multi-group" option for simultaneous scanning
15. Creating new color palettes
16. Setting up palettes and gain for 6 dB drop plotting C scan
17. Linking html procedures to set up files
18. Creating custom reports
19. Changing company logo in reports
20. Setting up USER menu
21. Locking/Unlocking a set up to only allow the user group adjustments
22. File manager tasks
23. Linking OmniScan to PC for data transfer
24. Advanced gate functions
25. peak or flank
26. different measurement points
27. Interface lock feature
28. explanation of flashing gates
29. Using the "A scan" envelope feature
30. Fast Furrier Transfer feature
31. Tomoview overview and practical exercises

A detailed course manual covering the above functions in a step by step format, will be provided to each attendee.

Attendees are encouraged to bring along their own instruments and probes or at least their own Compact flash cards, so that work performed during the course can be kept by the attendee.

Any actual defect samples that the attendees are using phased array techniques on may also be brought to the course for procedure development help during the course.

(A certificate of course attendance will be given to each attendee and the course can be used for ASNT NDT Level III re-certification points).