Metrología óptica

KIF-PU-F

Formulario de solicitud de cotización

Obtenga una cotización
para este producto

¿Preguntas?

This is an interferometer for analyzing a transmitted wavefront and a reflected wavefront on flat-surface optical components such as prisms or mirrors, particularly on the optical pickup production line.

Descripción
Especificaciones
Software
Folleto en PDF

Measurement possible according to the angle of reflection of an object to be measured
The folded reflection plane with a variable angle allows measurement according to the reflection angle specification of an object to be measured. The transmitted and reflected wavefronts of a beam splitter, etc. can also be measured on the same reflection plane.
Available for measurement of 405 nm-band and 650 nm-band lenses
This system is standard-equipped with two-wavelength light sources of 405nm and 658nm which can be switched in a simple operation, thereby allowing evaluation of optical components with either wavelength.
Capable of switching between liner and circular polarized light
To measure a polarization-dependent test substance to be used for an optical pickup component, switching between liner and circular polarized light is needed. This system is optimal for transmitted wavefront measurement of birefringent components such as a plastic and crystal.
Compact and high-rigidity
The compact and high-rigidity main unit takes up less space in view of the operating environments on the shop floor, thus supporting quick quality inspections.
Available for OK/NG judgment
The dedicated software allows easy OK/NG judgment on a production line with the OK/NG judgment setup function in accordance with arbitrarily settable tolerances.

Transmitted Wavefront Measuring Interferometer for Flat Surfaces KIF-PU-F: Specifications
Measured wavelength	405 nm, 658 nm (laser class 2 product)
Interference method	Twyman-Green interferometer
Measured optical beam diameter	6mm dia. Measurable diameter: ø2 to ø6 mm
Measurable size	Approximately 2 to10 mm square (prism, mirror, etc.) 80 mm square, 1 to 5 mm thick, 45° reflection angle (flat mirror base before cutting) * Specification during use of an adjusting jig, etc.
Reflecting flat mirror accuracy	λ/30 (effective diameter: ø6 mm or less)
Reflecting plane rotatable range	50° to 180° (measurable reflection angle: 0° and 25° more)
Reflecting mirror operating range	±2°
Polarization specification	Switching between circular and linear polarized light
Magnification	1X, 3X (digital magnification switching)
Auto-focusing	Available
Analysis method	Fringe scanning method
System mass	Main unit: Approx. 26 kg (excluding the PC)
System dimensions	Main unit: 330 (W) x 465 (D) x 370 (H) mm
Power source specification	100 to 240 VAC 50/60 Hz, 100 VA
Operating environments	Level place with minimum vibration (floor vibration: ±0.8 m/s2 or less) Temperature: 23±3 °C Humidity: 60% or less, with no condensation

* This system shall not guarantee absolute accuracy in conformity with the traceability system.

Transmitted Wavefront Measuring Interferometer KIF-PU：Software

Features

1.Analysis result display functions

・P-V, RMS, Pwr
・Seidel aberrations (tilt, focus, astigmatism, coma, spherical aberration)
・Zernike coefficients (3, 4, 9, 16, 25, 36 terms)
・3D bird's-eye view, 2D color map
・Cross-section profile (X-direction, Y-direction, PV, RMS)
・OK/NG judgment result

2.File input/output functions

・Save/read of work parameters
・Save/read of fringe data
・Save/read of mask data
・Save/read of screen layouts
・Main window printing

3.Mask functions

・Mask setting (square, circular, polygonal, auto-masking)
・Auto mask setting

4.Work parameters setup functions

・Product name, unit name, comment
・Wavelength (405/658 nm)
・Fitting order (3/4/9/16/25/36)
・Aberration elimination (aberration specification/Zernike coefficient specification)
・Display units (λ, μm, nm, fringe)
・Offset setting for Zernike coefficients
・Rated values (each aberration specification and user-defined expression)

Loading...