NDT Systems Instrumentation

Los instrumentos industriales de Olympus son reconocidos como unidades de adquisición de alto rendimiento y se utilizan en los sistemas integrados de inspección ofrecidos directamente por Olympus NDT, o por los diferentes integradores de sistemas distribuidos a través de todo el mundo.

QuickScan LT PA

The QuickScan LT PA (16:256 or 32:256) is the latest generation of phased array acquisition units developed by Olympus for industrial inspection systems. The acquisition unit meets IP 55 standards, and was specifically designed for easy integration into industrial environments. The unit is managed by Quickview advanced software designed for ultrasonic and eddy current inspection.

QuickScan UT

The QuickScan UT is a multichannel ultrasound system for industrial applications. This system offers many powerful features ideally suited to high-speed ultrasound inspections, such as in-line testing, and is managed by Quickview advanced software designed for ultrasonic and eddy current inspection.

QuickScan EC

The QuickScan EC is designed to inspect ferrous and nonferrous materials using multicoil ECA probes. The capabilities and flexibility of this system make it suitable for many applications, such as surface inspections or measurement of material properties. This system is managed by Quickview advanced software designed for ultrasonic and eddy current inspection.

OmniScan iX UT

Este instrumento está diseñado para inspeccionar a gran velocidad componentes de la industria y de la fabricación aeroespacial, la industria automotriz, los componentes soldados y los sistemas integrados de inspección. Cuenta con la certificación DFO P3TF22, P3TF30, P3TF31 y P3TF35 de GE.

TomoScan Focus LT

El TomoScan FOCUS LT está diseñado para los sistemas de inspección automatizados e industriales más exigentes, con configuración para los ultrasonidos convencionales y phased array con múltiples palpadores. Es controlado por el software de gran versatilidad TomoView.


Inspection & Measurement Systems
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Soluciones avanzadas de NDT

Detectores de defectos

Sistemas Integrados de Inspección