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Titulares

Inspección de componentes calientes hasta 150 °C con la solución phased array para altas temperaturas de Olympus
XRF para el control del proceso de extracción de metales
IPLEX NX:Olympus‘ Most Advanced Industrial Videoscope for Critical Inspection Tasks.
XRD para la confirmación de ingredientes farmacéuticos activos
Inspección de tuberías mediante ondas guiadas
Comparación entre los ensayos XRF y los ensayos ICP-AES en el análisis de suelos
New application: Manual Weld Inspection with Eddy Current
New application: Surface profile of the light guide plate for LCDs / Non-contact 3D shape measurement using a laser microscope
New application: Surface profile evaluation for thermal spraying / Surface roughness measurement using a laser microscope
New application: Shape and surface roughness measurements of screws / Surface roughness measurement using a laser microscope
New application: Evaluating the surface profile (roughness) of coated abrasives / Non-contact 3D shape measurement using a laser microscope
New application: Surface observation of ink-jet paper and regular paper / Non-contact 3D profile evaluation using a laser microscope
New application: Quality management in working with extra-fine tubes / Surface roughness analysis of a micro area using a laser microscope
New application: Detecting flaws in heat-treated aluminum alloy parts / Various microscopy techniques using digital microscopes
New application: Metal flow analysis of forged products / 3D shape measurement using a digital microscope
New application: Shape evaluation of a marking stamped on a metal surface / 3D shape measurement using a digital microscope
New application: Ripple marks formed in die-casting / 3D shape measurement using a digital microscope
Newly designed ergonomic units for SZX series stereo microscopes allow the user to adopt a natural pose, boosting productivity and reducing the fatigue associated with microscope use.
The OLYMPUS Stream captures high-resolution images with a wide field by the Instant MIA function.
The BX53M system microscope, which features workflow support that extends from observation to reporting.

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