The Panametrics EPOCH 4 PLUS is an advanced digital ultrasonic flaw detector featuring a multi-color LCD and a host of new features to meet challenging inspection requirements. It combines powerful flaw detection and measurement capabilities, extensive data storage, and the ability to transfer detailed inspection data to the PC via its high-speed USB port.
The EPOCH 4 PLUS incorporates all of the advanced signal processing features of the industry proven EPOCH 4, including a 25MHz RF bandwidth to permit testing of thin materials, narrowband filters to improve signal-to-noise in high gain applications, a negative spike pulser for applications requiring higher frequencies, and a selectable square wave pulser to optimize penetration on thick or highly attenuating materials. EPOCH 4 PLUS features include a USB communications port, Echo-Echo in RF mode, Automatic or Manual Polarity Detection in RF mode, EMAT transducer optimization capability, and optional Backwall Echo Attenuator. In addition, the Memory/Datalogger has an improved storage capacity with a combination of 6,400 waveforms/calibrations and 128,000 thickness readings. An External Trigger In/Out feature permits pulser input from a synchronized external device, allowing a high degree of positional accuracy. | ||||||||||||||||||||||||||||||||||||
Features | ||||||||||||||||||||||||||||||||||||
• Customizable narrowband filtering
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Ultrasonic Flaw Detector | ||||||||||||||||||||||||||||||||||||
A multi-color LCD with a waveform that dynamically changes color
Software Options
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EPOCH 4PLUS Specifications* | ||||||||||||||||||||||||||||||||||||
Ordering Information EPOCH 4PLUS, Advanced, Microprocessor-Based Ultrasonic Flaw Detector. Includes: EP-MCA Mini Charger Adapter EPXT-BAT-N Nickel Metal Hydride Rechargeable Battery EP4P/CAL-NIST NIST Calibration Certificate EP4P/MAN Instruction Manual EP4/TC Transport Case EP4/PS Stainless Steel Pipe Stand EP4/HS Hand Strap
*All specifications are subject to change without notice. Some Epoch 4Plus ApplicationsWe are sorry, we could not find an Application Note matching your search criteria. |
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