
The OmniScan MX UT performs conventional UT and automated inspections and supports TOFD as well as encoded B-scan and C-scan, and full data storage. Allows inspections that simultaneously combine TOFD with conventional pulse echo.

This kit includes the OmniScan MX UT, the manual Remote Scan B-scan position encoder, TomoView Lite software, and a dual-UT probe. This kit addresses your B-scan inspection needs-for spot checks and one-line scans on ferrous steel structures, plates, pipes, and more.

| Remote Scan, B-scan position encoder | OmniScan MX UT (2 channels) | TomoView Lite for postprocessing |
| Module | Acquisition | Analysis |
| UT | MXU 2.0R27 | OmniPC 3.1R34 |
| TomoView 2.10R25 | TomoView 2.10R2 | |
| PA | MXU 2.0R27 | OmniPC 4.0R26 |
| TomoView 2.10R25 | TomoView 2.10R2 |
Notes:
4 Not compatible with version later than 3.1
5 OSTV 1.7R7 required
6 OmniPC 3.2R2 also compatible
| General | |
|
Overall dimensions
(W x H x D) |
244 mm x 182 mm x 57 mm
(9.6 in. x 7.1 in. x 2.1 in.) |
| Weight | 1 kg (2.2 lb) |
| Connectors | LEMO® 00 (2, 4, or 8) |
| Pulser | |
| Number of pulsers | 2, 4, or 8 |
| Pulse output |
50 V, 100 V, 200 V, 300 V ±10 %
(variable pulse width) |
| Pulse width | Adjustable from 30 ns to 1000 ns ±10 %, resolution of 2.5 ns |
| Fall time | Less than 7 ns |
| Pulse shape | Negative square wave |
| Output impedance | Less than 7 Ω |
| Receiver | |
| Number of receivers | 2, 4, or 8 |
| Receiver gain range | 0 dB to 100 dB, by steps of 0.1 dB |
| Maximum input signal | 20 Vp-p (screen at 128 %) |
| Minimum sensitivity | 200 µVp-p (screen at 128 %) |
| Noise referred to input | 160 µVp-p (26 µV RMS) (128 %) |
| Input impedance | 50 Ω |
|
Input filter
(100 % bandwidth) |
Centered at 1 MHz (1.5 MHz),
centered at 2 MHz (2.25 MHz), centered at 5 MHz (4 MHz), centered at 10 MHz (12 MHz), centered at 15 MHz, centered at 20 MHz; 0.25 MHz to 2.5 MHz, 2 MHz to 25 MHz BB |
| System bandwidth | 0.25 MHz to 32 MHz (-3 dB) |
| Rectifier | Both, positive, negative |
| Mode | PE (pulse-echo), PC (pitch-catch), TT (through-transmission). In PC mode the maximum number of pulsers equals the number of channels divided by 2. |
| Smoothing | Digital |
| DAC | |
| Number of points | 16 |
| DAC range | Up to 40 dB |
| Maximum gain slope | 20 dB/µs |
| Data acquisition | |
| A-scan acquisition rate | 6000 A-scans/s (512-point A-scan) |
| Maximum pulsing rate | 1 channel at 12 kHz (C-scan) |
| Data processing | |
| Real-time averaging | 2, 4, 8, 16 |
| Gates | |
| Quantity | 3: I (synchro), A and B (measure) |
| Synchronization | I, A, B referenced on main bang; A and B referenced on gate I (post-synchronization) |
| Data storage | |
| A-scan recording (TOFD) |
6000 A-scans/s (512-point A-scan)
(3 MB/s transfer rate) |
| C-scan type data recording |
12 000 (A1, A2, A3, T1, T2, T3) (3 gates)
12 kHz (lower frequency for corrosion mapping) |
| Data visualization | |
| Refresh rate | 60 Hz |
| Data synchronization | |
| On time | 1 Hz to 12 kHz |
| On encoder | On 1 or 2 axes divided into 1 to 65 536 steps |
| Alarms | |
| Number | 3 |
| Conditions | Any logical combination of gates |
| Signal | Amplitude or TOF of gate A or B |
Time-of-Flight Diffraction Testing

Time-of-flight diffraction (TOFD) is a technique that uses two probes in pitch-catch mode. TOFD detects and records signals diffracted from defect tips allowing both detection and sizing. The TOFD data is displayed in a grayscale B-scan view. TOFD offers wide coverage and amplitude-independent sizing complying with the ASME‑2235 code.
TOFD and Pulse-Echo Testing


While TOFD is a very powerful and efficient technique, its coverage is limited as a result of two inspection dead zones: one dead zone is near the surface, the other is at the backwall.
The OmniScan® UT allows inspections that simultaneously combine TOFD with conventional pulse echo. Pulse echo complements TOFD, covering the dead zones.
0‑Degree Testing (Corrosion and Composite)

0-degree testing measures the time-of-flight and amplitude of ultrasonic echoes reflecting from the part into gates in order to detect and measure defects.
Full-Featured C‑Scan

Full-Featured B‑Scan
Full-Featured A‑Scan


Step-by-Step Calibration Wizards
All calibration procedures are guided using step-by-step wizards.
TOFD Option

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