February 08, 2008 Olympus NDT Introduces the OmniScan iX for Component Testing
Olympus NDT has introduced the OmniScan iX, an ultrasonic flaw detector system designed for the high-speed testing of critical industrial components. This powerful and flexible industrial flaw detector can be configured for 2, 4, or 8 conventional ultrasound channels. The system features a high-resolution VGA display, multiple A-scan, C-scan and strip chart displays, 16 logical alarms, 16 analog outputs, and a helical scan mode. The compact OmniScan iX is housed in
a rugged benchtop casing and is also available in a 5U rack-mount version for easy integration into in-line production testing systems.
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