Inspection & Measurement Systems

News

Headlines

Olympus is pleased to introduce the palm-sized, IPLEX UltraLite videoscope
Olympus Awards Research & Discovery Grant to The Institute of Archaeology
Olympus awarded a Research & Discovery Grant to The Institute of Archaeology at University College London, London, UK. The Awarded Proposal, Portable XRF for the Study of Artifacts at Jamestown, the First British Colony in America, is being directed by Dr. Martinon-Torres, Senior Lecturer at University College.
San Francisco State University Awarded Research & Discovery Grant To Study Heavy Metal Content Of Cosmetics And Skin Care Products
Olympus Innov-X awarded a Research & Discovery Grant to San Francisco State University, San Francisco CA. The awarded proposal, Portable XRF for the Analysis of Heavy Metal Content in Skin Care Products, is being directed by Dr. Pete Palmer, Professor of Chemistry and Biochemistry at San Francisco State.
Industrial Imaging, Measurement And Analysis Topics Covered In Olympus Online Educational Video Gallery
Olympus has expanded its comprehensive Industrial Microscopy Online Education Center with a new video gallery full of helpful presentations on such important industrial research topics as roughness analysis, counting and measuring, report generation, imaging and more.
Olympus is pleased to introduce the BXiS metallurgical microscope system.
Fingerprint Pharmaceutical Compounds Fast with New Low-Cost, Small Benchtop XRD
The new TomoView software compatible with the OmniScan MX2 data files
Educative videos of surface metrology are now available in the video gallery.
Olympus MX microscope sytems for the efficient semiconductor inspections.
Olympus creates an impact at NAB show with i-SPEED TR
New features added to i-SPEED 3 to expand it's capability

Advanced NDT Solutions

Flaw Detectors

Integrated Inspection Systems