
The BondMaster is a versatile, full-multimode instrument offering pitch-catch, MIA (mechanical impedance analysis), and resonance modes. Allows users to select the best method for a particular application and to test bonds and inspect a wide variety of composite materials.
Pitch-Catch mode uses high-frequency sound waves to transmit surface waves into the test part. A separate receiving element, a set distance from the transmitter, picks up the energy transmitted into the material. The sound waves are carried in a plate-wave mode across the test piece between the two probe tips.
| Part Code | Item Number | Description |
| 9317797 | U8010012 | S-PC-P11: Spring-loaded tips, 17 mm (0.67 in.) tip spacing, low voltage |
| 9322074 | U8770334 | S-PC-P12: Fixed tips, 17 mm (0.67 in.) tip spacing, high voltage |
| 9322076 | U8770336 | S-PC-P13: Spring-loaded tips, 17 mm (0.67 in.) tip spacing, high voltage |
| 9323945 | U8800601 | S-PC-P14: Spring-loaded tips, 15 mm (0.59 in.) tip spacing, high voltage |
| 9323954 | U8629399 | S-PC-P15: Spring-loaded tips, 13mm (0.51 in.) tip spacing, high voltage |
| 9323952 | U8010062 | S-PC-P16:Spring-loaded tips, 15 mm (0.59 in.) tip spacing, high voltage |
| 9322184 | U8010039 | SPO-5629-PHV: Spring-loaded tips, 13 mm (0.51 in.) tip spacing, high voltage. |
| 9323942 | U8010054 | S-PC-DHV: Differential High Voltage, four spring-loaded tips |
The Mechanical Impedance Analysis (MIA) test mode uses a single-tipped dual-element probe. A drive element generates sound waves and a receive element detects the effect of the structure on probe-tip loading.
| Part Code | Item Number | Description |
| 9317806 | U8010013 | S-MP-1: Right angle probe, 12.7 mm (0.5 in.) tip diameter. |
| 9317807 | U8010014 | S-MP-2: Straight probe, 6.35 mm (0.25 in.) tip diameter. |
| 9317796 | U8010011 | S-MP-3: Right angle probe, 12.7 mm (0.5 in.) tip diameter. |
| 9317808 | U8010015 | S-MP-4: Right angle probe, 6.35 mm (0.25 in.) tip diameter. |
| 9322075 | U8770335 | S-MP-5: Right angle probe, 12.7 mm (0.5 in.) tip diameter. |
The Resonance mode contact transducer is driven at its resonant frequency and coupled to the sample using a low-viscosity couplant. Impedance changes in the sensor are analyzed to detect changes in the test sample.
| Part Code | Item Number | Description |
| 9317809 | U8010016 | S-PR-1: 35 kHz (±5 kHz) in a 15.9 mm (0.63 in.) diameter case |
| 9317810 | U8010017 | S-PR-2: 65 kHz (±10 kHz) in a 15.9 mm (0.63 in.) diameter case |
| 9317793 | U8010008 | S-PR-3: 110 kHz (±10 kHz) in a 15.9 mm (0.63 in.) diameter case |
| 9317794 | U8010009 | S-PR-4: 165 kHz (±10 kHz) in a 12.7 mm (0.5 in.) diameter case |
| 9317795 | U8010010 | S-PR-5: 250 kHz (±10 kHz) in a 9.5 mm (0.37 in.) diameter case |
| 9317811 | U8010018 | S-PR-6: 330 kHz (±10 kHz) in a 9.5 mm (0.37 in.) diameter case |
| Part Code | Item Number | Description |
| BM-KIT-PC1 | U8010069 |
BondMaster Probe and Standard Kit for Pitch-Catch Inspections
Contains: NEC-6407 Reference Standard with S-PC-P14 Pitch-Catch Probe and Cable |
| BM-KIT-PC2 | U8010070 |
BondMaster Probe and Standard Kit for Pitch-Catch Inspections
Contains: NEC-6407 Reference Standard with S-PC-P14 and SPO-5629PHV Pitch-Catch Probes and Cable |
| BM-KIT-MIA | U8010071 |
BondMaster Probe and Standard Kit for MIA Inspections
Contains: NEC-6407 Reference Standard with S-MP-3 MIA Probe and BMM-H Spring Holder and Cable |
| BM-KIT-RES-C | U8010072 |
BondMaster Probe and Standard Kit for Resonance Inspections
Contains: NEC-6382 Composite Reference Standard with S-PR-4 Resonance Probe, Couplant and Cable |
| BM-KIT-RES-A | U8010073 |
BondMaster Probe and Standard Kit for Resonance Inspections
Contains: NEC-6384 Aluminum Reference Standard with S-PR-4 Resonance Probe, Couplant and Cable |
| BM-KIT-PMR | U8010074 |
BondMaster Probe and Standard Kit for Pitch-Catch, MIA and Resonance Inspections
Contains: NEC-6407 Reference Standard, S-PC-P14 and SPO-5629PHV Pitch-Catch Probes, S-MP-3 MIA Probe with BMM-H Spring Holder, NEC-6382 Composite Reference Standard, NEC-6384 Aluminum Reference Standard, S-PR-4 Resonance Probe, Couplant and Cables |
BondMaster 1000e+ SpecificationsInspection Methods
Probes and Accessories
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The BondMaster 1000e+ allows users to select the best method for a particular application and to inspect a wide variety of composite materials. Its high performance, light weight, and rugged durability make it the ideal choice for applications related to the manufacturing, maintenance, and repair of composite materials.
With customer-interchangeable displays, the BondMaster 1000e+ offers users the highest resolution available today. The availability of a color or monochrome LCD for indoor or bright outdoor conditions, or a high-bright electroluminescent display (ELD) for normal to dark conditions provides the ultimate in flexibility and convenience. Its rugged, well-designed housing, uncomplicated front panel, SmartKnob™, and built-in PowerLink™ technology make the BondMaster 1000e+ a truly revolutionary and user-friendly handheld flaw detector.
The BondMaster 1000e+ uses PowerLink technology to automatically configure the instrument when a probe is connected. Built-in calibration modes assist the user in optimizing the test parameters. A variety of probes is available for each of the test technologies.
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