Mikroskopie

CX31-P

CX31-P

The CX31-P microscope is ideal for polarized light observations. Compact in design , yet capable of technically advanced tasks such as retardation measurements , the CX31P is a wise choice for daily laboratory use.

High Optical Performance

Space Saving High Performance Polarizing Microscope

CX31-P space saving body offers high quality polarized images and a wide range of options.This model is a cost-effective solution with a versatility of functions.

Example Observation Images
Biotite Granite
Biotite Granite
Quartz Diorite
Quartz Diorite
Tencel
Tencel
Sodium Urate
Sodium Urate

Objective Lenses Dedicated to Polarized Light

Choose from specially manufactured strain-free objective lenses (PLN4xP, ACHN-P and UPLFLN-P) that are designed to ensure the highest quality images during polarized observations.

UPLFLN-P Series
UPLFLN-P Series
UPLFLN-P Series Specifications
Product NameNumerical Aperture
(N.A.)
Working Distance
(W.D.)
UPLFLN4XP 0.13 17.0mm
UPLFLN10XP 0.3 10.0mm
UPLFLN20XP 0.5 2.1mm
UPLFLN40XP 0.75 0.51mm
UPLFLN100XOP 1.3 0.2mm

ACHN-P Series
ACHN-P Series
ACHN-P Series Specifications
Product NameNumerical Aperture
(N.A.)
Working Distance
(W.D.)
ACHN10xP 0.25 6.0mm
ACHN20xP 0.40 3.0mm
ACHN40xP 0.65 0.45mm
ACHN100xOP 1.25 0.13mm

Improved Polarizer and Analyzer

Specially designed condenser and polarizing filters offer, high EF value* and provide greatly enhanced polarized light images.
* EF value: the ratio of brightness of parallel Nicols to crossed Nicols. The higher is the EF value, the less is the distortion of the optical system. This means that a higher EF value is superior in polarization characteristics.

Orthoscopic/ Conoscopic Observation

Various operations are centralized including switching between the conoscopic and orthoscopic methods by the insertion/removal of a Bertrand lens.

Peridotite (crossed polarizers)
Peridotite (crossed polarizers)
Conoscopic image of a biaxial crystal (topaz)
Conoscopic image of a biaxial crystal (topaz)

High-rigid Frame that Prevents Image Blurring

To make the most of the superior optical performance, the basic performance has been enhanced with a highly rigid frame, interior focus mechanism and stage.

Binocular Observation Tube that Allows Interpupillary Adjustment without Precise Reticle Alignment

The binocular observation tube has a mechanism that allows interpupillary adjustment without inclination of the reticle such as a cross-hair in an objective lens. This enables exact alignment of the vibration direction of polarization.

Accessories Supporting High-level Polarized Observation

Precise Centering

The circular rotatable stage has two centering knobs and allows smooth sample rotation. A selectable click stop every 45 degrees enables accurate observation and measurement.

Picture of Rotating Stage

x-y mechanical stage
X-Y Mechanical Stage
For added versatility an x-y mechanical specimen holder is available for easy x-y movement of one's specimen. Mounting an attachable cross movement mechanical stage (U-FMP) onto the circular rotatable stage allows precision x-y focus, especially useful at higher magnifications. Interference between the mechanical stage and the objectives is eliminated, and images of superb quality can be effortlessly observed with all objective magnification.

Objective Lens Centering Adapters
Objective Lens Centering Adapters
Four objective centering adapters center your objective for precise specimen observation.

Wide Choice of Compensators

Retardation Measuring Ranges of Various Compensators
CompensatorMeasuring RangeMajor Application
U-CTB Thick Berek 0-11,000nm Measurement of Large Retardation (R*>3λ), (Crystal, Giant Molecule, Fiber, Photoelastic Distortion, etc.)
U-CBE Berek 0-1,640nm Retardation Measurement (Crystal, Giant Molecule, Fiber, Body Tissue, etc.)
U-CSE Senarmont 0-546nm Retardation Measurement (Crystal, Body Tissue, etc.)
Contrast Intensification (Body Tissue, etc.)
U-CBR1 Brace-Kohler 1/10λ 0-55nm Minute Retardation Measurement (Crystal, Body Tissue, etc.)
Contrast Intensification (Bbody Tissue, etc.)
U-CBR2 Brace-Kohler 1/30λ 0-20nm
U-CWE2 Quarts Wedge 500-2,200nm Preliminary Measurement of Retardation (Crystal, Giant Molecule, etc.)
* R stands for retardation.
The concurrent use of interference filter 45IF546 is recommended for improving measuring accuracy. (Except U-CWE2)

Test Plate/Compensator
Test Plates/Compensators

Easy Adaptation of Digital Cameras, Image Analysis Software and Automated Accessories

The OLYMPUS Stream Image Analysis Software has been designed specifically for industrial microscopy applications with intuitive menus and advanced software routines. Users are empowered with the latest image analysis and management solutions to satisfy specific application requirements.

> Click here for the Olympus' lineup of digital cameras
> Click here for the Olympus' lineup of software options

Back to top

Compact Polarizing Microscope CX31-P Specifications
Optical System UIS2 Optical System (Infinity-corrected)
Microscope Frame Observation Method BF/KPO*/PO
Reflected/Transmitted Transmitted
Illumination System 30 W Halogen
Intermediate Attachment Changeover between Orthoscopic/ Conoscopic Observation Engage or Disengage of Bertrand Lens
Bertrand Lens Capable of Focusing
Analyzer 180° Rotatable, Mininum Graduation 2° (Readout Down to 0.1° Possible by Using the Vernier)
Focus Stroke 25 mm
Resolution/Fine Adjustment Sensitivity Fine Stroke per Rotation 0.2 mm
Revolving Nosepiece Quadruple for BF (Fixed on the Main Unit)
Observation Tube Standard Field (Field Number 20) Binocular/Trinocular Observation Tube
Widefield (Field Number 22) Binocular/Trinocular Observation Tube
Stage Polarizing Rotatable Stage (Fixed on the Main Unit)
Option Sensitive Tint Plate, Compensator
Dimensions Conoscope/Orthoscope Combined 233(W)x374(D)x455(H)mm
Orthoscope Combined 233(W)x374(D)x455(H)mm
Weight Conoscope/Orthoscope Combined 8.7 kg (in Standard Combination)
Orthoscope Combined 8.7 kg (in Standard Combination)
Remark *Simple Polarized Light Observation

CX31-P Compact Polarizing Microscope

Loading...

Inspection & Measurement Systems
English | 日本語 | français | 简体中文 | Deutsch | italiano | čeština | magyar | Tiểng Việt | Español | русский | polski | português | 한국어

Erweiterte Lösungen für die zerstörungsfreie Prüfung

Flaw Detectors

Integrated Inspection Systems

XRF and XRD Analyzers