Phased Array Inspection

Phased Array Technology


Phased array technology enables the generation of an ultrasonic beam where parameters such as angle, focal distance, and focal point size are controlled through software. Furthermore, this beam can be multiplexed over a large array. These capabilities open a series of new possibilities. For instance, it is possible to quickly vary the angle of the beam to scan a part without moving the probe itself. Phased arrays also allow replacing multiple probes and mechanical components. Inspecting a part with a variable-angle beam also maximizes detection regardless of the defect orientation, while optimizing signal-to-noise ratio.

Benefits of Phased Arrays

Phased array technology offers the following benefits:

• Software control of beam angle, focal distance, and spot size
• Multiple-angle inspection with a single, small, electronically-controlled multielement probe
• Greater flexibility for the inspection of complex geometry
• High-speed scans with no moving parts

Phased Array Software

Full-Featured A-Scans, B-Scans, and C-Scans


The OmniScan® PA builds upon the OmniScan UT feature set and offers full-featured A-scan, B-scan, and C-scan displays.

Full-Featured Sectorial Scan

• Real-time volume-corrected representation
• Higher than 20-Hz refresh rate (up to 40 Hz)

Advanced Real-Time Data Processing

• Real-time data interpolation to improve spatial representation of defects during acquisition of data
• User-selectable high-pass and low-pass filters to enhance A‑scan and imaging quality
• Projection feature allows the operator to view vertically positioned
• A-scan simultaneously with sectorial scan image.

Calibration Procedures and Parameters

All calibration procedures are guided by a step-by-step menu using Next and Back navigation.

Wizards for Groups and Focal Laws

• The Group Wizard allows you to enter all probe, part, and beam parameters, and generate all focal laws in one step instead of generating them with each change.
• The step-by-step approach prevents the user from missing a parameter change.
• Online help provides general information on parameters to be set.

Multiple-Group Option

It is now possible to manage more than one probe with two different configurations: different skews, different scanning types, different inspection areas, and other parameters.

Possible Configurations for Multiple-Group Inspection

A Use one single phased array probe of 64 or more elements and create 2 different groups:

• Linear scan at 45º to cover the upper part using skips on the bottom surface
• Linear scan at 60º to cover the lower part

B Use one single phased array probe of 64 or 128 elements and create 2 different groups:

• Linear scan at 0º at low gain
• Linear scan at 0º at higher gain

C Use one phased array probe of 64 or 128 elements and create 3 different groups:

• Linear scan at 45º to cover the upper part using skips on the bottom surface
• Linear scan at 60º to cover the lower part
• Sectorial scan from 35º to 70º to increase probability of detection

D Use two phased array probes of 16 or 64 elements and create 2 different groups:

• Sectorial scan from 35º to 70º for inspection from left side of the part using skips on the bottom surface
• Sectorial scan from 35º to 70º for inspection from right side of the part using skips on the bottom surface

Phased Array Module Specifications
(Applies to OMNI-M-PA16128)

* Models 16:16, 16:16M, 16:64M, 32:32, and 32:128 also available